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图片 型号 厂商 标准 分类 描述
Image: MNDS26F32MJRQMLV MNDS26F32MJRQMLV Texas Instruments quad differential line receivers also available guaranteed TO 100k rad(Si) tested TO mil-std-883, method 1019.5, condition A
Image: MNDS26F32MWR-QML MNDS26F32MWR-QML Texas Instruments quad differential line receivers also available guaranteed TO 100k rad(Si) tested TO mil-std-883, method 1019.5, condition A
Image: MNDS26F32MW/883 MNDS26F32MW/883 Texas Instruments quad differential line receivers also available guaranteed TO 100k rad(Si) tested TO mil-std-883, method 1019.5, condition A
Image: ADC12441 ADC12441 Texas Instruments 集成电路 dynamically-tested self-calibrating 12-bit plus sign A/D converter with sample-and-hold
Image: ADC12441CMJ ADC12441CMJ Texas Instruments dynamically-tested self-calibrating 12-bit plus sign A/D converter with sample-and-hold
Image: LMV227SD LMV227SD Texas Instruments 半导体 production RF tested, RF power detector for cdma and Wcdma
Image: LMV227SDX LMV227SDX Texas Instruments 半导体 production RF tested, RF power detector for cdma and Wcdma
Image: SIR880DP SIR880DP Vishay Siliconix 半导体 N-channel 80 V (D-S) mosfet 100 % uis tested
Image: LMV227 LMV227 Texas Instruments 半导体 production RF tested, RF power detector for cdma and Wcdma 6-wson
Image: ADC12451 ADC12451 Texas Instruments 集成电路 dynamically-tested self-calibrating 12-bit plus sign A/D converter with sample-and-hold
Image: ADC12451883 ADC12451883 Texas Instruments dynamically-tested self-calibrating 12-bit plus sign A/D converter with sample-and-hold
Image: ADC12451CMJ ADC12451CMJ Texas Instruments dynamically-tested self-calibrating 12-bit plus sign A/D converter with sample-and-hold
Image: RFFM5765Q RFFM5765Q RF Micro Devices 无源元器件 RF 前端 (LNA + PA) tested in accordance with aec-q100 802.11b/g/n wifi front end module
Image: C8051F390-GDI C8051F390-GDI Silicon Laboratories Inc 嵌入式解决方案 评估板 - 嵌入式 - MCU, DSP tested 50 mips 16 kB flash mixed-signal mcu die in wafer form
Image: C8051F850-GDI C8051F850-GDI Silicon Laboratories Inc 嵌入式解决方案 评估板 - 嵌入式 - MCU, DSP tested 25 mips 8 kB flash mixed-signal mcu die in wafer form
Image: BT-301-50M BT-301-50M Wakefield 工具 化学物质 these adhesives were tested in our laboratory for flame retardancy properties. according to our test results they meet the requirements of ul94hb.
Image: LMH6723 LMH6723 Texas Instruments 半导体 晶体管 宽电源电压范围 m2901:2ー36vdcor ± 1ー ± 18vdclarge 信号带宽和摆率100% tested370mhz 带宽(av = 1，vout = 0.5 vpp)-3 db bw260mhz (av = + 2 v/v，vout = 0.5 vpp)-3 db bw1 ma 电源电流电流电流输出 t110ma，0.03% ,0.11 ° 差分增益，0.1 db 增益平坦度至100mhz/fast 转换速率: 600v/sunity 增益稳定单位供应范围为4.5ー12v,(lmh6723)甚低电源电流漏极(0.8 ma)ー与电源电压无关的输入偏置电流: 25nalow 输入偏置电流: ± 5nalow 输入偏置电压: ± 3mvv 输入共模电压范围包括 gndmr 差分输入电压范围等于电源电压低输出饱和电压: 250mv，在与 ttl，dtl，ecl，mos 和逻辑系统兼容的4倍输出电压下

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